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1

Current State of Avogadro ${}^{28}$Si sphere S8

Nicolaus, R. Arnold, Bartl, Guido, Bettin, Horst, Borys, Michael, Firlus, Martin, Busch, Ingo, Felgner, Andre, Kruger-Sehm, Rolf, Krumrey, Michael, Krystek, Michael, Kuetgens, Ulrich

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2013

Language:

english

File:

PDF, 1.38 MB

english, 2013

2

Messunsicherheit bei der Bestimmung von Rauheitskennwerten mit Tastschnittgeräten (Uncertainty of Measurement in the Determination of Roughness Parameters Using Contact Stylus Instruments)

Krüger-Sehm, Rolf, Seewig, Jörg

Journal:

tm - Technisches Messen

Year:

2007

Language:

german

File:

PDF, 408 KB

german, 2007

3

Calibration of stylus profilometers using standards calibrated by metrological SFMs

Dai, Gaoliang, Jung, Lena, Koenders, Ludger, Krüger-Sehm, Rolf

Journal:

Journal of Physics Conference Series

Year:

2005

Language:

english

File:

PDF, 524 KB

english, 2005

4

SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 12 April 2010)] Optical Micro- and Nanometrology III - Comparability and uncertainty of shape measurements with white-light interferometers

Boedecker, S., Gorecki, Christophe, Asundi, Anand K., Bauer, W., Krüger-Sehm, R., Osten, Wolfgang, Lehmann, P. H., Rembe, C.

Year:

2010

Language:

english

File:

PDF, 2.33 MB

english, 2010

5

Traceable calibration standard for the lateral axis of contact stylus instruments

R. Krüger-Sehm, W. Häßler-Grohne, J. Frühauf

Journal:

Year:

2004

Language:

english

File:

PDF, 209 KB

english, 2004

6

Determination of the short wavelength cutoff of interferential and confocal microscopes

Rolf Krüger-Sehm, Joachim Frühauf, Thorsten Dziomba

Journal:

Year:

2008

Language:

english

File:

PDF, 1.09 MB

english, 2008

7

A new wavelet filtering for analysis of fractal engineering surfaces

P. Bakucz, R. Krüger-Sehm

Journal:

Year:

2009

Language:

english

File:

PDF, 622 KB

english, 2009

8

Proposal for a guideline to calibrate interference microscopes for use in roughness measurements

R Krüger-Sehm, J.A Luna Perez

Journal:

International Journal of Machine Tools and Manufacture

Year:

2001

Language:

english

File:

PDF, 496 KB

english, 2001

9

[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - State of the Avogadro 28Si spheres

Nicolaus, R. A., Bartl, G., Bettin, H., Busch, I., Borys, M., Kruger-Sehm, R., Krumrey, M., Kuetgens, U.

Year:

2012

Language:

english

File:

PDF, 121 KB

english, 2012

10

EUROMET.L-S11 comparison on surface texture

Koenders, L, Andreasen, J L, Chiffre, L De, Jung, L, Krüger-Sehm, R

Journal:

Year:

2004

Language:

english

File:

PDF, 1.68 MB

english, 2004

11

Virtuelle Messgeräte: Definition und Stand der Entwicklung (Virtual Measuring Instruments: Definition and Development Status)

Schmitt, Robert, Koerfer, Friedel, Sawodny, Oliver, Zimmermann, Jan, Krüger-Sehm, Rolf, Xu, Min, Dziomba, Thorsten, Koenders, Ludger, Goch, Gert, Tausendfreund, Andreas, Patzelt, Stefan, Simon, Sven,

Journal:

tm - Technisches Messen

Year:

2008

Language:

german

File:

PDF, 728 KB

german, 2008

12

Wavelet-Filterung von fraktalen Oberflächen (Wavelet Filtering of Fractal Surfaces)

Bakucz, Peter, Krüger-Sehm, Rolf, Schröder, Sven, Duparré, Angela, Tünnermann, Andreas

Journal:

tm - Technisches Messen

Year:

2008

Language:

german

File:

PDF, 530 KB

german, 2008

13

Chirp-Kalibriernormale für Oberflächenmessgeräte (Chirp Calibration Standards for Surface Measuring Instruments)

Krüger-Sehm, Rolf, Bakucz, Peter, Jung, Lena, Wilhelms, Harald

Journal:

tm - Technisches Messen

Year:

2007

Language:

german

File:

PDF, 357 KB

german, 2007

14

Trends bei der Entwicklung von Normalen für die Mikro- und Nanomesstechnik: Herausforderungen und Lösungsansätze (Trends in Development of Standards for Micro- and Nanometrology: Chances and Challenges)

Weckenmann, Albert, Wiedenhöfer, Thomas, Büttgenbach, Stephanus, Krah, Thomas, Fleischer, Jürgen, Buchholz, Ivesa, Viering, Benjamin, Kranzmann, Axel, Ritter, Martin, Krüger-Sehm, Rolf, Bakucz, Peter,

Journal:

tm - Technisches Messen

Year:

2008

Language:

german

File:

PDF, 318 KB

german, 2008

15

Measurement of micro-roughness using a metrological large range scanning force microscope

G. Dai, L. Jung, F. Pohlenz, H. Danzebrink, R. Krüger-sehm, K. Hasche, G. Wilkening

Year:

2004

Language:

english

File:

PDF, 727 KB

english, 2004

16

Neural network approximation of tip-abrasion effects in AFM imaging

Bakucz, Peter, Yacoot, Andrew, Dziomba, Thorsten, Koenders, Ludger, Krüger-Sehm, Rolf

Journal:

Measurement Science and Technology

Year:

2008

Language:

english

File:

PDF, 1.72 MB

english, 2008

17

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Combined interference and scanning force microscope

Danzebrink, Hans U., Osten, Wolfgang, Takeda, Mitsuo, Tyrrell, James W. G., Dal Savio, Claudio, Kruger-Sehm, Rolf

Year:

2004

Language:

english

File:

PDF, 369 KB

english, 2004

18

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Comparison of methods for the determination of the aperture correction of interference microscopes

Kruger-Sehm, Rolf, Ottevaere, Heidi, DeWolf, Peter, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 557 KB

english, 2005